@book{71884,
	author = {International Symposium for Testing and Failure Analysis and Electronic Device Failure Analysis Society,},
	title = {ISTFA 2013 :},
	publisher = {ASM International,},
	year = {2013.},
	address = {Materials Park, Ohio :},
	url = {http://site.ebrary.com/lib/rucke/Doc?id=10909850}
}