02261nam a2200385 i 4500 ebr10909850 CaPaEBR m o d cr cn||||||||| 140830t20132013ohuado ob 001 0 eng d 9781627080224 9781627080231 (e-book) CaPaEBR eng rda pn CaPaEBR (OCoLC)891400347 TK7871 .I584 2013eb 621.381 23 International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California) ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / sponsored by Electronic Device Failure Analysis Society. Materials Park, Ohio : ASM International, 2013. �2013 1 online resource (633 pages) : color illustrations, charts, photographs, graphs, tables text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references at the end of each chapters and index. Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2014). Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronics Materials Testing Congresses. Electronic apparatus and appliances Testing Congresses. Electronic books. Electronic Device Failure Analysis Society, sponsor. Print version: International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California) ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA. Materials Park, Ohio : ASM International, c2013 xix, 613 pages 9781627080224 ebrary. http://site.ebrary.com/lib/rucke/Doc?id=10909850 An electronic book accessible through the World Wide Web; click to view 71884 71884