TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - Electronic Device Failure Analysis Society,
TI  - ISTFA 2013: conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA 
AV  - TK7871 .I584 2013eb
U1  - 621.381 23
PY  - 2013///
CY  - Materials Park, Ohio
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
N1  - Includes bibliographical references at the end of each chapters and index
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10909850
ER  -