TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - Electronic Device Failure Analysis Society.
ED  - ebrary, Inc.
TI  - ISTFA '99: proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California
AV  - TK7871.85 .I48 1999eb
PY  - 1999///
CY  - Materials Park, OH
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Sponsored by EDFAS, ISTFA; Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10323467
ER  -