01665nam a2200337Ia 4500001001200000003000800012006001900020007001500039008004100054020001500095040002100110035002100131050002700152111010000179245018300279246008400462246009800546260005300644300002500697500003100722504005100753533015200804650004900956650006201005655002901067710002301096710004801119710001701167856012601184999001701310ebr10323467CaPaEBRm        u        cr cn|||||||||000406s1999    ohua    sb    101 0 eng d  z0871706466  aCaPaEBRcCaPaEBR  a(OCoLC)64681778814aTK7871.85b.I48 1999eb2 aInternational Symposium for Testing and Failure Analysisn(25th :d1999 :cSanta Clara, Calif.)10aISTFA '99h[electronic resource] :bproceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.30aProceedings of the 25th International Symposium or Testing and Failure Analysis30aConference Proceedings from the 25th International Symposium for Testing and Failure Analysis  aMaterials Park, OH :bASM International,cc1999.  axvii, 486 p. :bill.  aSponsored by EDFAS, ISTFA.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronicsxMaterialsxTestingvCongresses. 0aElectronic apparatus and appliancesxTestingvCongresses. 7aElectronic books.2local2 aASM International.2 aElectronic Device Failure Analysis Society.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10323467zAn electronic book accessible through the World Wide Web; click to view  c75487d75487