02283nam a2200421 i 4500 ebr10828215 CaPaEBR m o d cr cn||||||||| 130219t20122012sz a ob 101 0 eng|d 9783037853818 (hardback) 9783038136996 (e-book) CaPaEBR eng rda pn CaPaEBR (OCoLC)872671166 QH212.E4 I57 2011eb 502.825 23 International Conference on Electron Microscopy (14th : 2011 : Wis�a, Poland), issuing body. Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / edited by Danuta Str�o�z and Krystian Prusik. Electron microscopy 14 Durnten-Zurich, Switzerland ; Enfield, NH, USA : TTP, [2012] �2012 1 online resource (352 pages) : illustrations (some color). text rdacontent computer rdamedia online resource rdacarrier Solid state phenomena, 1012-0394 ; volumes 186 Includes bibliographical references and indexes. Description based on print version record. Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electron microscopy Congresses. Electronic books. Str�o�z, Danuta. Prusik, Krystian. Print version: International Conference on Electron Microscopy. Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland. Durnten-Zurich, Switzerland : TTP, [2012] xiii, 341 pages ; 25 cm. Solid state phenomena ; volumes 186 1012-0394 ; 9783037853818 (OCoLC)ocn801662615 (DLC) 2012538041 ebrary. Diffusion and defect data. Pt. B, Solid state phenomena ; volumes 186. http://site.ebrary.com/lib/rucke/Doc?id=10828215 An electronic book accessible through the World Wide Web; click to view 84442 84442