01319nam a2200337Ia 4500001001200000003000800012006001900020007001500039008004100054010001700095020001800112040002100130035002100151050002200172082001700194245015000211260005700361300002700418504005100445533015200496650002100648650002100669650004500690650002100735655002900756700001700785700001900802710001700821856012600838999001700964ebr10412605CaPaEBRm        u        cr cn|||||||||100617s2010    enka    sb    001 0 eng d  z  2010024537  z9780470747483  aCaPaEBRcCaPaEBR  a(OCoLC)66986187514aHD61b.O66 2010eb04a658.15/522200aOperational risk managementh[electronic resource] :ba practical approach to intelligent data analysis /cedited by Ron S. Kenett, Yossi Raanan.  aChichester ;a[Hoboken] :bJohn Wiley & Sons,c2010.  axxxvii, 285 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2010.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aRisk management. 0aQuality control. 0aInformation technologyxQuality control. 0aProcess control. 7aElectronic books.2local1 aKenett, Ron.1 aRaanan, Yossi.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10412605zAn electronic book accessible through the World Wide Web; click to view  c86551d86551