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301.
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Image from Google Jackets
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302.
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303.
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306.
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307.
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308.
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ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Material type:  Text; Format:
electronic
available online
 ; Literary form:
Not fiction
Publication details: Materials Park, OH : Asm International, c2008
Other title:
- Proceedings of the 34th International Symposium for Testing and Failure Analysis
- 34th International Symposium for Testing and Failure Analysis
- Thirty-fourth International Symposium for Testing and Failure Analysis
Availability: No items available.
star rating
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309.
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Practical guide to image analysis [electronic resource]. by
Material type: Text; Format:
electronic
available online
; Literary form:
Not fiction
Publication details: Materials Park, OH : ASM International, c2000
Availability: No items available.
star rating
Average : 0.0 out of 5 stars
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310.
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316.
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