000			01694nam a2200373 i 4500
001			ebr10788041
003			CaPaEBR
006			m o d
007			cr cn|||||||||
008			131107s2014 njua ob 001 0 eng d
020			_z9781118288238
020			_a9781118723142 (e-book)
040			_aCaPaEBR _beng _erda _epn _cCaPaEBR
035			_a(OCoLC)868954409
050	1	4	_aTA417.23 _b.S336 2014eb
082	0	4	_a620.1/127 _223
245	0	0	_aScanning probe microscopy for industrial applications : _bnanomechanical characterization / _cedited by Dalia G. Yablon.
264		1	_aHoboken, New Jersey : _bWiley, _c2014.
264		4	_c�2014
300			_a1 online resource (385 pages) : _billustrations (some color), graphs
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
504			_aIncludes bibliographical references at the end of each chapters and index.
588			_aDescription based on print version record.
590			_aElectronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650		0	_aMaterials _xMicroscopy.
650		0	_aScanning probe microscopy _xIndustrial applications.
655		0	_aElectronic books.
700	1		_aYablon, Dalia G., _d1975-
776	0	8	_iPrint version: _tScanning probe microscopy for industrial applications : nanomechanical characterization. _dHoboken, New Jersey : Wiley, c2014 _hxix, 347 pages _z9781118288238 _w2013009638
797	2		_aebrary.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10788041 _zAn electronic book accessible through the World Wide Web; click to view
999			_c135452 _d135452