| 000 | 01288nam a2200325 a 4500 | ||
|---|---|---|---|
| 001 | ebr10422353 | ||
| 003 | CaPaEBR | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 100416s2010 si a sb 000 0 eng d | ||
| 010 | _z 2010278394 | ||
| 020 | _z9789814277433 | ||
| 020 | _z9814277436 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 035 | _a(OCoLC)630166345 | ||
| 050 | 1 | 4 |
_aTA169 _b.S765 2010eb |
| 082 | 0 | 4 |
_a620/.00452 _222 |
| 245 | 0 | 0 |
_aStochastic reliability modeling, optimization and applications _h[electronic resource] / _ceditors, Syouji Nakamura, Toshio Nakagawa. |
| 260 |
_aSingapore ; _aHackensack, NJ : _bWorld Scientific, _cc2010. |
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| 300 |
_axvi, 300 p. : _bill. |
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| 504 | _aIncludes bibliographical references. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aReliability (Engineering) _xMathematical models. |
|
| 650 | 0 | _aStochastic systems. | |
| 655 | 7 |
_aElectronic books. _2local |
|
| 700 | 1 | _aNakamura, Syouji. | |
| 700 | 1 |
_aNakagawa, Toshio, _d1942- |
|
| 710 | 2 | _aebrary, Inc. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/rucke/Doc?id=10422353 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c142034 _d142034 |
||