000 01322nam a2200325 a 4500
001 ebr10675083
003 CaPaEBR
006 m u
007 cr cn|||||||||
008 100505s2010 nyua sb 001 0 eng d
010 _z 2010016691
020 _z9781606929780 (hardcover)
020 _z9781616685249 (e-book)
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)775352830
050 1 4 _aTK7882.B56
_bD47 2010eb
082 0 4 _a006.4
_222
245 0 0 _aDesign and performance of biometric system
_h[electronic resource] /
_cJohn T. Elsworth, editor.
260 _aNew York :
_bNova Science Publishers,
_cc2010.
300 _aix, 114 p. :
_bill. (some col.).
490 1 _aComputer science, technology and applications
504 _aIncludes bibliographical references (p. 104-105) and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aBiometric identification.
655 7 _aElectronic books.
_2local
700 1 _aElsworth, John T.
710 2 _aebrary, Inc.
830 0 _aComputer science, technology and applications.
856 4 0 _uhttp://site.ebrary.com/lib/rucke/Doc?id=10675083
_zAn electronic book accessible through the World Wide Web; click to view
999 _c164072
_d164072