000 01252nam a22003134a 4500
001 ebr10320384
003 CaPaEBR
006 m u
007 cr cn|||||||||
008 050525s2005 ohua sb 001 0 eng
010 _z 2005050106
020 _z0871708167
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)729262390
050 1 4 _aTK7870.15
_b.L425 2005eb
082 0 4 _a621.381/046
_222
245 0 0 _aLead-free solder interconnect reliability
_h[electronic resource] /
_cedited by Dongkai Shangguan.
260 _aMaterials Park, OH :
_bASM International,
_c2005.
300 _ax, 292 p. :
_bill.
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aMicroelectronic packaging
_xReliability.
650 0 _aSolder and soldering.
650 0 _aLead-free electronics manufacturing processes.
655 7 _aElectronic books.
_2local
700 1 _aShangguan, Dongkai,
_d1963-
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/rucke/Doc?id=10320384
_zAn electronic book accessible through the World Wide Web; click to view
999 _c174730
_d174730