000			01414nam a2200337 a 4500
001			ebr10250326
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			080131s2008 njua sb 001 0 eng
010			_z 2008004929
020			_z9780470129487 (cloth)
020			_z0470129484 (cloth)
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)646762013
050	1	4	_aTK7874 _b.S36 2008eb
082	0	4	_a621.3845/6 _222
100	1		_aScott, Allan W.
245	1	0	_aRF measurements for cellular phones and wireless data systems _h[electronic resource] / _cAllan W. Scott, Rex Frobenius.
260			_aHoboken, N.J. : _bIEEE : _bWiley & Sons, _cc2008.
300			_axx, 503 p. : _bill.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aRadio frequency integrated circuits _xTesting.
650		0	_aWireless communication systems _xEquipment and supplies _xDesign and construction.
650		0	_aCell phones _xEquipment and supplies _xDesign and construction.
655		7	_aElectronic books. _2local
700	1		_aFrobenius, Rex.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10250326 _zAn electronic book accessible through the World Wide Web; click to view
999			_c35656 _d35656