000			02237nam a2200397 i 4500
001			ebr10998999
003			CaPaEBR
006			m o d
007			cr cn|||||||||
008			150109t20142014ohuao o 001 0 eng d
020			_z9781627080743
020			_a9781627080750 (e-book)
040			_aCaPaEBR _beng _erda _epn _cCaPaEBR
035			_a(OCoLC)900889018
050	1	4	_aTK7871 _b.I884 2014eb
082	0	4	_a621.381 _223
111	2		_aInternational Symposium for Testing and Failure Analysis _n(40th : _d2014 : _cHouston, Tex.)
245	1	0	_aISTFA 2014 : _bconference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / _corganized by Electronic Device Failure Analysis Society, ASM International.
264		1	_aMaterials Park, Ohio : _bASM International, _c2014.
264		4	_c�2014
300			_a1 online resource (560 pages) : _bcolor illustrations, photographs
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
500			_aIncludes index.
588			_aDescription based on online resource; title from PDF title page (ebrary, viewed January 9, 2014).
590			_aElectronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		0	_aElectronic books.
710	2		_aElectronic Device Failure Analysis Society, _eorganizer.
710	2		_aASM International, _eorganizer.
776	0	8	_iPrint version: _aInternational Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) _tISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA. _dMaterials Park, Ohio : ASM International, c2014 _hxx, 540 pages _z9781627080743
797	2		_aebrary.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10998999 _zAn electronic book accessible through the World Wide Web; click to view
999			_c39948 _d39948