000			01286nam a22003134a 4500
001			ebr10065742
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			990128s2000 enka sb 000 0 eng
010			_z 99018754
020			_z052155490X (hb)
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)228069387
050	1	4	_aQC611.98.H54 _bC43 2000eb
082	0	4	_a537.6/23/0284 _221
245	0	0	_aCharacterization of high Tc materials and devices by electron microscopy _h[electronic resource] / _cedited by Nigel D. Browning, Stephen J. Pennycook.
260			_aCambridge ; _aNew York : _bCambridge University Press, _c2000.
300			_axii, 391 p. : _bill.
504			_aIncludes bibliographical references.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aHigh temperature superconductors.
650		0	_aElectron microscopy _xTechnique.
655		7	_aElectronic books. _2local
700	1		_aBrowning, Nigel D.
700	1		_aPennycook, Stephen J.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10065742 _zAn electronic book accessible through the World Wide Web; click to view
999			_c48576 _d48576