| 000 | 01329nam a22003254a 4500 | ||
|---|---|---|---|
| 001 | ebr10067254 | ||
| 003 | CaPaEBR | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 020827s2003 maua sb 001 0 eng | ||
| 010 | _z 2002034049 | ||
| 020 | _z1402072554 (alk. paper) | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 035 | _a(OCoLC)229172199 | ||
| 050 | 1 | 4 |
_aTK7895.M4 _bA27 2003eb |
| 082 | 0 | 4 |
_a621.39/732 _221 |
| 100 | 1 | _aAdams, R. Dean. | |
| 245 | 1 | 0 |
_aHigh performance memory testing _h[electronic resource] : _bdesign principles, fault modeling, and self-test / _cR. Dean Adams. |
| 260 |
_aBoston : _bKluwer Academic, _cc2003. |
||
| 300 |
_axiii, 246 p. : _bill. |
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| 490 | 1 | _aFrontiers in electronic testing | |
| 504 | _aIncludes bibliographical references (p. [229]-239) and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aSemiconductor storage devices _xTesting. |
|
| 650 | 0 |
_aComputer storage devices _xTesting. |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 | _aebrary, Inc. | |
| 830 | 0 | _aFrontiers in electronic testing. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/rucke/Doc?id=10067254 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c49006 _d49006 |
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