000			01431nam a2200301 a 4500
001			ebr10627944
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			121211s2012 ohuad sb 101 0 eng d
020			_z1615039791
020			_z9781615039791
020			_z9781615039951 (e-book)
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)823729131
050	1	4	_aTK7801 _b.I58 2012eb
111	2		_aInternational Symposium for Testing and Failure Analysis _n(38th : _d2012 : _cPhoenix Convention Center)
245	1	0	_aISTFA 2012 _h[electronic resource] : _bconference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
260			_aMaterials Park, Ohio : _bASM International, _c2012.
300			_axxi, 620 p. : _bill. (some col.)
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		7	_aElectronic books. _2local
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10627944 _zAn electronic book accessible through the World Wide Web; click to view
999			_c50849 _d50849