000			01495nam a2200337Ia 4500
001			ebr10331638
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			090924s2009 ne a sb 101 0 eng d
020			_z9781607500230
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)491265005
050	1	4	_aTA417.3 _b.E484 2009eb
111	2		_aInternational Workshop on Electromagnetic Nondestructive Evaluation _n(13th : _d2008 : _cSeoul, Korea)
245	1	0	_aElectromagnetic nondestructive evaluation (XII) _h[electronic resource] / _cedited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song.
260			_aAmsterdam : _bIOS, _c2009.
300			_axxvii, 416 p. : _bill.
490	1		_aStudies in applied electromagnetics and mechanics, _x1383-7281 ; _vv. 32
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectromagnetic measurements _vCongresses.
650		0	_aNondestructive testing _vCongresses.
655		7	_aElectronic books. _2local
700	1		_aShin, Young-Kil.
700	1		_aLee, Hyang-Beom.
700	1		_aSong, Sung-Jin.
710	2		_aebrary, Inc.
830		0	_aStudies in applied electromagnetics and mechanics ; _vv. 32.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10331638 _zAn electronic book accessible through the World Wide Web; click to view
999			_c51402 _d51402