000 01268nam a2200301Ia 4500
001 ebr10087124
003 CaPaEBR
006 m u
007 cr cn|||||||||
008 940126s1994 nyua sb 001 0 eng d
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)228117554
050 1 4 _aQH212.S32
_bS27 1994eb
100 1 _aSarid, Dror.
245 1 0 _aScanning force microscopy
_h[electronic resource] :
_bwith applications to electric, magnetic, and atomic forces /
_cDror Sarid.
250 _aRev. ed.
260 _aNew York :
_bOxford University Press,
_c1994.
300 _axiii, 263 p. :
_bill.
490 1 _aOxford series in optical and imaging sciences ;
_v5
504 _aIncludes bibliographical references (p. 233-259) and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aScanning force microscopy.
650 0 _aSurfaces (Physics)
655 7 _aElectronic books.
_2local
710 2 _aebrary, Inc.
830 0 _aOxford series in optical and imaging sciences ;
_v5.
856 4 0 _uhttp://site.ebrary.com/lib/rucke/Doc?id=10087124
_zAn electronic book accessible through the World Wide Web; click to view
999 _c51631
_d51631