000			01445nam a2200349Ia 4500
001			ebr10078628
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			030814s2003 maua sb 000 0 eng d
010			_z 2003061871
020			_z1402075898 (alk. paper)
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)232158235
050	1	4	_aTK7895.E42 _bF38 2003eb
082	0	4	_a004.2/56 _222
245	0	0	_aFault injection techniques and tools for embedded systems reliability evaluation _h[electronic resource] / _cedited by Alfredo Benso and Paolo Prinetto.
260			_aBoston : _bKluwer Academic Publishers, _cc2003.
300			_axiv, 241 p. : _bill.
490	1		_aFrontiers in electronic testing ; _v23
504			_aIncludes bibliographical references (p. [231]-241).
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aEmbedded computer systems _xTesting.
650		0	_aEmbedded computer systems _xReliability.
650		0	_aFault location (Engineering)
655		7	_aElectronic books. _2local
700	1		_aBenso, Alfredo.
700	1		_aPrinetto, Paolo.
710	2		_aebrary, Inc.
830		0	_aFrontiers in electronic testing ; _v23.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10078628 _zAn electronic book accessible through the World Wide Web; click to view
999			_c54595 _d54595