000			01701nam a2200337Ia 4500
001			ebr10328966
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			040219s2003 ohua sb 001 0 eng d
020			_z9780871707888
020			_z0871707888
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)646827315
050	1	4	_aTK7871 _b.I68 2003eb
111	2		_aInternational Symposium for Testing and Failure Analysis _n(29th : _d2003 : _cSanta Clara, Calif.)
245	1	0	_aISTFA 2003 _h[electronic resource] : _bproceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / _csponsored by EDFAS.
246	3	0	_aProceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003
246	3	4	_aConference proceedings from the 29th International Symposium for Testing and Failure Analysis
260			_aMaterials Park, Ohio : _bASM International, _c2003.
300			_a518 p. : _bill.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		7	_aElectronic books. _2local
710	2		_aASM International.
710	2		_aElectronic Device Failure Analysis Society.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10328966 _zAn electronic book accessible through the World Wide Web; click to view
999			_c54780 _d54780