| 000 | 01563nam a2200325Ia 4500 | ||
|---|---|---|---|
| 001 | ebr10330016 | ||
| 003 | CaPaEBR | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 021220s2002 ohua sbf 001 0 eng d | ||
| 020 | _z0871707691 | ||
| 020 | _z9780871707697 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 035 | _a(OCoLC)609419839 | ||
| 050 | 1 | 4 |
_aTK7871 _b.M52 2002eb |
| 245 | 0 | 0 |
_aMicroelectronic failure analysis _h[electronic resource] : _bdesk reference. _p2002 supplement / _cprepared under the direction of the Electronic Device Failure Analysis Society publications committee. |
| 260 |
_aMaterials Park, OH : _bASM International, _cc2002. |
||
| 300 |
_avi, 210 p. : _bill. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting _vHandbooks, manuals, etc. |
|
| 650 | 0 |
_aElectronics _xMaterials _xTesting _vHandbooks, manuals, etc. |
|
| 650 | 0 |
_aMicroelectronics _xMaterials _xDefects _vHandbooks, manuals, etc. |
|
| 650 | 0 |
_aMicroelectronics _xMaterials _xTesting _vHandbooks, manuals, etc. |
|
| 650 | 0 |
_aSemiconductors _xDefects _vHandbooks, manuals, etc. |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 | _aElectronic Device Failure Analysis Society. | |
| 710 | 2 | _aebrary, Inc. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/rucke/Doc?id=10330016 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c55422 _d55422 |
||