000			01362nam a2200325Ia 4500
001			ebr10083772
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			030701s2003 si a sb 001 0 eng d
020			_z9812380574
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)70732306
050	1	4	_aTA169 _b.K68 2003eb
100	1		_aKotz, Samuel.
245	1	4	_aThe stress-strength model and its generalizations _h[electronic resource] : _btheory and applications / _cSamuel Kotz, Yan Lumelskii, Marianna Pensky.
260			_aSingapore ; _aHong Kong : _bWorld Scientific, _cc2003.
300			_axvii, 253 p. : _bill.
504			_aIncludes bibliographical references (p. 233-249) and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aReliability (Engineering) _xStatistical methods.
650		0	_aEstimation theory.
650		0	_aDistribution (Probability theory)
650		0	_aMathematical statistics.
655		7	_aElectronic books. _2local
700	1		_aLumel�ski�i, �I�An Petrovich.
700	1		_aPensky, Marianna.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10083772 _zAn electronic book accessible through the World Wide Web; click to view
999			_c56005 _d56005