000			01673nam a2200337Ia 4500
001			ebr10320364
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			010517s2000 ohua sb 101 0 eng d
020			_z0871707012
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)647829189
050	1	4	_aTA409 _b.I577 2000eb
111	2		_aInternational Symposium for Testing and Failure Analysis _n(26th : _d2000 : _cBellevue, Wash.)
245	1	0	_aISTFA 2000 _h[electronic resource] : _bproceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
246	3	0	_aProceedings of the 26th International Symposium or Testing and Failure Analysis
246	3		_aConference Proceedings from the 26th International Symposium for Testing and Failure Analysis
260			_aMaterials Park, OH : _bASM International, _cc2000.
300			_axvi, 577 p. : _bill.
500			_a"Sponsored by EDFAS, ISTFA".
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		7	_aElectronic books. _2local
710	2		_aASM International.
710	2		_aElectronic Device Failure Analysis Society.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10320364 _zAn electronic book accessible through the World Wide Web; click to view
999			_c60864 _d60864