000			01569nam a2200325Ia 4500
001			ebr10320372
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			020606s2001 ohua sb f 001 0 eng d
020			_z9780871707451
020			_z0871707454 (pbk.)
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)647829197
050	1	4	_aTK7871 _b.M53 2001eb
245	0	0	_aMicroelectronic failure analysis _h[electronic resource] : _bdesk reference : 2001 supplement / _cprepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.
260			_aMaterials Park, OH : _bASM International, _cc2001.
300			_av, 171 p. : _bill.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vHandbooks, manuals, etc.
650		0	_aMicroelectronics _xMaterials _xTesting _vHandbooks, manuals, etc.
650		0	_aMicroelectronics _xMaterials _xDefects _vHandbooks, manuals, etc.
650		0	_aElectronic apparatus and appliances _xTesting _vHandbooks, manuals, etc.
650		0	_aSemiconductors _xDefects _vHandbooks, manuals, etc.
655		7	_aElectronic books. _2local
710	2		_aElectronic Device Failure Analysis Society.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10320372 _zAn electronic book accessible through the World Wide Web; click to view
999			_c60871 _d60871