000			01731nam a2200349Ia 4500
001			ebr10320377
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			020214s2001 ohua sb 101 0 eng d
020			_z9780871707468
020			_z0871707462
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)647829209
050	1	4	_aTK7871 _b.I69 2001eb
111	2		_aInternational Symposium for Testing and Failure Analysis _n(27th : _d2001 : _cSanta Clara, Calif.)
245	1	0	_aISTFA 2001 _h[electronic resource] : _bproceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / _csponsored by EDFAS.
246	3	0	_aProceedings of the 27th International Symposium or Testing and Failure Analysis
246	3	0	_aConference Proceedings from the 27th International Symposium for Testing and Failure Analysis
260			_aMaterials Park, OH : _bASM International, _cc2001.
300			_axix, 485 p. : _bill.
500			_aSponsored by EDFAS, ISTFA.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		7	_aElectronic books. _2local
710	2		_aASM International.
710	2		_aElectronic Device Failure Analysis Society.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10320377 _zAn electronic book accessible through the World Wide Web; click to view
999			_c60875 _d60875