000 02261nam a2200385 i 4500
001 ebr10909850
003 CaPaEBR
006 m o d
007 cr cn|||||||||
008 140830t20132013ohuado ob 001 0 eng d
020 _z9781627080224
020 _a9781627080231 (e-book)
040 _aCaPaEBR
_beng
_erda
_epn
_cCaPaEBR
035 _a(OCoLC)891400347
050 1 4 _aTK7871
_b.I584 2013eb
082 0 4 _a621.381
_223
111 2 _aInternational Symposium for Testing and Failure Analysis
_n(39th :
_d2013 :
_cSan Jose, California)
245 1 0 _aISTFA 2013 :
_bconference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
_csponsored by Electronic Device Failure Analysis Society.
264 1 _aMaterials Park, Ohio :
_bASM International,
_c2013.
264 4 _c�2013
300 _a1 online resource (633 pages) :
_bcolor illustrations, charts, photographs, graphs, tables
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references at the end of each chapters and index.
588 _aDescription based on online resource; title from PDF title page (ebrary, viewed August 30, 2014).
590 _aElectronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650 0 _aElectronics
_xMaterials
_xTesting
_vCongresses.
650 0 _aElectronic apparatus and appliances
_xTesting
_vCongresses.
655 0 _aElectronic books.
710 2 _aElectronic Device Failure Analysis Society,
_esponsor.
776 0 8 _iPrint version:
_aInternational Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California)
_tISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA.
_dMaterials Park, Ohio : ASM International, c2013
_hxix, 613 pages
_z9781627080224
797 2 _aebrary.
856 4 0 _uhttp://site.ebrary.com/lib/rucke/Doc?id=10909850
_zAn electronic book accessible through the World Wide Web; click to view
999 _c71884
_d71884