000			01665nam a2200337Ia 4500
001			ebr10323467
003			CaPaEBR
006			m u
007			cr cn|||||||||
008			000406s1999 ohua sb 101 0 eng d
020			_z0871706466
040			_aCaPaEBR _cCaPaEBR
035			_a(OCoLC)646817788
050	1	4	_aTK7871.85 _b.I48 1999eb
111	2		_aInternational Symposium for Testing and Failure Analysis _n(25th : _d1999 : _cSanta Clara, Calif.)
245	1	0	_aISTFA '99 _h[electronic resource] : _bproceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
246	3	0	_aProceedings of the 25th International Symposium or Testing and Failure Analysis
246	3	0	_aConference Proceedings from the 25th International Symposium for Testing and Failure Analysis
260			_aMaterials Park, OH : _bASM International, _cc1999.
300			_axvii, 486 p. : _bill.
500			_aSponsored by EDFAS, ISTFA.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		7	_aElectronic books. _2local
710	2		_aASM International.
710	2		_aElectronic Device Failure Analysis Society.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/rucke/Doc?id=10323467 _zAn electronic book accessible through the World Wide Web; click to view
999			_c75487 _d75487