| 000 | 01252nam a2200289Ia 4500 | ||
|---|---|---|---|
| 001 | ebr10570978 | ||
| 003 | CaPaEBR | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 120813s2012 ts a sb 001 0 eng d | ||
| 020 | _z9781608053599 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 035 | _a(OCoLC)811371628 | ||
| 050 | 1 | 4 |
_aTK7871.85 _b.W65 2012eb |
| 100 | 1 | _aWong, Terence K. S. | |
| 245 | 1 | 0 |
_aSemiconductor strain metrology _h[electronic resource] : _bprinciples and applications / _cTerence K.S. Wong. |
| 260 |
_a[Saif Zone, Sharjah, U.A.E] ; _aOak Park, IL : _bBentham Science, _c[2012] |
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| 300 |
_a136 p. : _bill. |
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| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
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| 650 | 0 |
_aSemiconductors _xDesign and construction _xMaterials. |
|
| 650 | 0 |
_aCompound semiconductors _xDesign and construction _xMaterials. |
|
| 650 | 0 | _aSilicon-on-insulator technology. | |
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 | _aebrary, Inc. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/rucke/Doc?id=10570978 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c80757 _d80757 |
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