000 02283nam a2200421 i 4500
001 ebr10828215
003 CaPaEBR
006 m o d
007 cr cn|||||||||
008 130219t20122012sz a ob 101 0 eng|d
020 _z9783037853818 (hardback)
020 _a9783038136996 (e-book)
040 _aCaPaEBR
_beng
_erda
_epn
_cCaPaEBR
035 _a(OCoLC)872671166
050 1 4 _aQH212.E4
_bI57 2011eb
082 0 4 _a502.825
_223
111 2 _aInternational Conference on Electron Microscopy
_n(14th :
_d2011 :
_cWis�a, Poland),
_jissuing body.
245 1 0 _aElectron microscopy XIV :
_bselected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland /
_cedited by Danuta Str�o�z and Krystian Prusik.
246 3 0 _aElectron microscopy 14
264 1 _aDurnten-Zurich, Switzerland ;
_aEnfield, NH, USA :
_bTTP,
_c[2012]
264 4 _c�2012
300 _a1 online resource (352 pages) :
_billustrations (some color).
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
490 1 _aSolid state phenomena,
_x1012-0394 ;
_vvolumes 186
504 _aIncludes bibliographical references and indexes.
588 _aDescription based on print version record.
590 _aElectronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650 0 _aElectron microscopy
_vCongresses.
655 0 _aElectronic books.
700 1 _aStr�o�z, Danuta.
700 1 _aPrusik, Krystian.
776 0 8 _iPrint version:
_aInternational Conference on Electron Microscopy.
_tElectron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland.
_dDurnten-Zurich, Switzerland : TTP, [2012]
_hxiii, 341 pages ; 25 cm.
_kSolid state phenomena ; volumes 186
_x1012-0394 ;
_z9783037853818
_w(OCoLC)ocn801662615
_w(DLC) 2012538041
797 2 _aebrary.
830 0 _aDiffusion and defect data.
_nPt. B,
_pSolid state phenomena ;
_vvolumes 186.
856 4 0 _uhttp://site.ebrary.com/lib/rucke/Doc?id=10828215
_zAn electronic book accessible through the World Wide Web; click to view
999 _c84442
_d84442